Credence Unveils New High Density V/i Instrument for the Diamond Test Platform

Tag:apparatus instrument?Credence Unveil?the Diamond Test Platform
From:http://www.apparatus-instrument.com/

Industry-Leading Channel Density Enables Larger Multisite Counts, Allowing Higher Throughput for Customers Without Adding More Test Cells on the Production Floor
Credence Systems Corporation (NASDAQ: CMOS), a provider of automated test equipment (ATE) solutions for the worldwide semiconductor industry, unveiled the latest addition to its family of value-driven instruments for the Diamond test platform. The 72-channel HDVI (High Density Voltage/Current) instrument is targeted at significantly reducing the cost of test by enabling large numbers of sites to be tested in parallel. The HDVI instrument's high-precision source and measurement capability is ideal for testing microcontrollers, audio, video, wireless cellular, digital camera, baseband and power management devices used in a broad range of cost-sensitive applications.
The industry-leading V/I channel count of the HDVI -- up to 432 channels on the Diamond 10, and 1728 channels on the Diamond 40 -- results in significantly lower cost-per-channel. It also helps to free up more instrument slots in the tester, thereby enabling larger multisite configurations. When combined with the Diamond platform's other high-density instruments, HDVI increases the capacity of each test system and consequently reduces the number of test cells needed on the production floor. At the same time, throughput is dramatically increased by the high degree of parallel test capability.
"Our customers continue to face intense price pressures, which is driving higher-count multisite testing for cost of test and throughput improvements. SoC/SiP devices are also growing more complex through increasing integration of features, placing greater pin-count and test coverage demands on ATE," stated Amir Aghdaei, senior vice president of field operations and marketing at Credence. "Clearly, acquisition costs and operational efficiency of the test system have become especially critical. With the addition of the HDVI instrument, the Diamond platform can cost-effectively test higher site counts without additional capex demand, helping our customers to stay on top of rising demand and falling ASPs and thus meet profitability goals."
Diamond HDVI Instrument: Technology Summary
The HDVI instrument enables efficient use of test head resources (slots) via a broad range of functionality and innovative features that traditionally required multiple V/I options on other platforms. The HDVI contains 72 channels that can be operated in one of two modes: (1) Voltage/Current Supply (VIS) and (2) Precision Analog Source (PAS). The VIS mode offers 72 channels of general purpose, four-quadrant V/I capability for up to +/-7V and a maximum of +/-2A. In the PAS mode, each channel is capable of sourcing user-defined analog waveforms with very high accuracy for driving analog inputs of microcontrollers and embedded ADCs to perform INL and DNL tests.
Key HDVI features and benefits:
--  Industry-leading V/I channel density delivers best throughput and
    parallel test efficiency.
--  Built-in, high-bandwidth input matrix allows external instruments to
    connect to multi-use DUT pins and eliminate loadboard components.
--  Trigger control for source and measure memory synchronizes operation
    with tester or DUT events.
--  High-current performance on large number of pins provides coverage for
    the growing embedded power management features in battery-driven consumer
    products.
--  High-accuracy voltage ( < +/-0.9 mV) and current ( < +/-80 nA)
    measurements enable reliable testing of sensitive reference pins.